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Vanta™ iX In-Line XRF Analyzer

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Vanta™ iX In-Line XRF Analyzer for Automated Material Analysis

The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line:

  • Delivers instant results for real-time process monitoring and 100% inspection
  • Built to operate 24/7
  • Configured to deliver pass/fail results, accurate grade ID, and material chemistry

100% Inspection for Metal Fabrication of Tubes, Bars, and Rods

For organizations adopting Industry 4.0 practices and 24/7 process control to verify alloys with pass/fail analysis, the Vanta iX analyzer delivers material verification and lot/heat control for bar, billet, tube, and rod manufacturing, as well as machined parts and customized components. Automating your testing with a Vanta iX analyzer adds a competitive edge to your finished product since you can demonstrate that materials are 100% tested and verified.

Scanning and Monitoring for Ore Grade Control in Mining

For geological processing and mining, the Vanta iX analyzer enables core scanning and on-belt analysis with real-time results to monitor process variability and ensure ore grade consistency. During on-belt analysis, the analyzer provides blending verification and process validation of concentrates.

Fast and Accurate Elemental Analysis for Continuous Quality Control

Like all Vanta electronics, the Vanta iX analyzer works fast while delivering reliable, actionable results to guide critical decisions.

  • High resolution: ID a range of alloy grades—including light and heavy elements
  • Fast, accurate results: the analyzer’s electronics provide high throughput, stability, and count rate
  • Efficient: features a silicon drift detector (SDD) and the proven Axon Technology™ found in every Vanta analyzer

 

Dimensions (W × H × D) 10 cm × 7.9 cm × 26.6 cm (3.9 in. × 3.1 in. × 10.5 in.)
Weight 2.4 kg (5.29 lb)
Excitation Source X-ray tube: Rh or W anode (application optimized) 5–200 μA MR model: 8–50 keV (4 W max) CW model: 8–40 keV (4 W max)
Primary Beam Filtration Eight filter positions automatically selected per beam per method
Detector MR model: Large-area silicon drift detector CW model: Standard silicon drift detector
Power Power over Ethernet (PoE) or 18 V AC power adaptor
Elemental Range Method dependent: MR model: Mg–U CW model: Ti–U (with standard window and calibration)
Pressure Correction Built-in barometer for automatic altitude and air pressure correction
IP Rating IP54
Operating Environment Temperature range: –10 °C to 50 °C (14 °F to 122 °F) under continuous duty cycle Humidity: 10% to 90% relative humidity, non-condensing
Operating System Linux
Application Software Olympus proprietary data acquisition and processing package

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